X-Ray Diffractometry (XRD) Laboratory
Science Capability
Overview
X-ray diffractometry allows for compositional, structural, and stress analyses of natural (earth) and synthetic inorganic and organic materials over a temperature (room to 1200oC) range. Sample types include powder, intact solids, and thin films.
Centre Capacity
Empyrean-platform (Panalytical) x-ray diffractometer with high-speed spot and 1-D analysis; clay-mineral glycolation and thermal analyses; analytical software and phase ID database.
Personnel
- Professor George R. Dix, Department of Earth Sciences
- Professor Sean Barry, Department of Chemistry
- Professor Steve McGarry, Department of Electrical Engineering
- Professor Rong Liu, Department of Mechanical and Aerospace Engineering
- Administrative: Jianqun Wang, Faculty of Science
- Other: Graduate students, Undergraduate students
Industrial Application
Focus
Earth, chemical, and biological sciences; Engineering; Manufacturing; Forensic analysis; Provenance studies of material and art
Project Examples
Phase ID and abundance of geological (crystal, whole rock, soil and sediment) and engineered (metal, silica-based) materials; Fe/Mg/Ca compositional differentiation of carbonate rocks and sediment; quality assessment of engineered thin film (silica, metal) production
Engagement types and co-funding
- R&D partnerships (up to 80% cash contributions available)
- Contract Analysis
- Industrial-partnered student internships (up to 50% cash contributions available)
Point of Contact
Jeff Smirle, Business Manager- Faculty of Science; 613-875-1355